Review

Test instruments and systems probably have the longest shelf life of any electronic product. This phenomenon can be attributed to their adaptability to new tasks via test and measurement accessories, such as add-in modules, software, and specialized probes and adapters. Such was the case this year with established instruments adding more capabilities as well as a variety of generic offerings.

Tektronix's (tektronix.com) TDS6000 and TDS/CSA7000 series oscilloscopes from added speed and functionality with the RT-Eye serial data compliance and analysis software and P7350SMA differential probe. Both additions are designed to accelerate compliance and validation testing for emerging serial-data standards, such as PCI Express, Serial ATA and others. The RT-Eye application transforms the host scope into an automated validation and compliance testing platform for copper-based serial standards operating at data rates up to 3.2 Gb/s. It also provides software clock recovery, eye diagrams, and a range of parametric measurements in the amplitude, timing and jitter domains. The P7350SMA differential probe features a 5 GHz bandwidth and true differential connectivity via SMA connectors.

External mixers from Agilent Technologies (agilent.com) enhanced its PSA series spectrum analyzers by increasing their measurement frequency range from 50 GHz to as high as 325 GHz. Designated as Option AYZ, the accessory includes software for maintaining all the performance capabilities of the analyzers and takes advantage of the company's 110-GHz 11970 series harmonic mixers and the 75-GHz 11974 series pre-selected mixers, as well as mixers from third-party suppliers that offer coverage to 325 GHz. Other Option AYZ features include automatic harmonic-number setting or manual setting and amplitude correction.

A multiplexer card and an upgrade have expanded Keithley Instruments' (keithley.com) Integra series data acquisition and switch platforms. The Model 7710 module is a 20-channel, solid-state differential multiplexer with automatic cold-junction compensation (CJC) capability for temperature measurement with thermocouples. The Model 7700 differential multiplexer also distributes 20-channels with CJC, but has been upgraded with latching electro- mechanical relays that boost signal bandwidths up to 50 MHz.

From National Instruments (ni.com), a free software application for use with LabVIEW promises motion control developers the ability to tune and control piezo-based motors in high-precision applications. The Piezo Tuning Wizard provides the ability to eliminate unwanted velocity spikes and reduce oscillations. It also reduces development time with a user-friendly interface for characterizing and tuning.

Quite a few test-clip products entered the market for a wide range of generic applications. Targeting fine-pitch ICs, the DeltaProbe series test clips from Adapters. com (adapters.com) overcome the problems associated with probing high contact density packages, such as QFPs and TSOPs. The clip is available in 25 different configurations and pin counts ranging from 44 to 240. To compensate for the minute dimensional variations in packages from different vendors or manufacturing locations, DeltaProbes come with an array of wedge-shaped conductors that make contact by penetrating between the IC's legs.

For higher voltages and currents, Pomona Electronics' (pomonaelectronics. com) debuted a family of test-clip accessories with CAT III, 1,000V, 10A ratings that attach to terminals up to 0.30" O.D. in size. Features include safe, hands-free connections and a wide variety of clips and probe tip adapters.

—Mat Dirjish

Outlook

Accessories Hold Their Own—For Now
Obviously, established test systems and software suites that require a significant initial investment will be around for quite some time and will adapt to changes in technology with a variety of enhancements. Standards and design requirements change on a regular basis, providing room for growth in the accessory market for these systems.

But with the increasing popularity of remote-testing capabilities, the future of accessories for manual testing in the field—probes, clips, and leads, etc.—is difficult to predict. The greatest room for growth may be in the education and hobbyist technician/designer arenas.

In addition, makers of adapters and test clips for ICs will definitely face some ordeals over the coming years. Ever narrowing pin-pitch and increasing densities will demand very creative solutions.

—MD